IEEE - Institute of Electrical and Electronics Engineers, Inc. - A joint image quality assessment method based on global phase coherence and structural similarity

2010 3rd International Congress on Image and Signal Processing (CISP)

Author(s): Dan Wang ; Wenrui Ding ; Yiyun Man ; Le Cui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China, China
Conference Date: 16 October 2010
Volume: 5
Page(s): 2,307 - 2,311
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647786
Regular:

Structural similarity (SSIM) is one image quality assessment metric that focuses on the statistic information in the spatial domain. It cannot reflect the small details of the contrast and the... View More

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