IEEE - Institute of Electrical and Electronics Engineers, Inc. - Self-adaptation of tilted knitted fabric image

3rd International Congress on Image and Signal Processing (CISP 2010)

Author(s): Yi Liu ; Zhigui Liu
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China
Conference Date: 16 October 2010
Volume: 6
Page(s): 2,657 - 2,660
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5648106
Regular:

The tilting probability is tremendous when collecting knitted fabric images. It will bring mistakes, even errors, when calculating longitude density and latitude density, etc. In allusion to this... View More

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