IEEE - Institute of Electrical and Electronics Engineers, Inc. - The registration of scattered point clouds with Gauss-Markoff model

3rd International Congress on Image and Signal Processing (CISP 2010)

Author(s): Jie Lu ; Xiaoyun Li ; Guohong Liu
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China
Conference Date: 16 October 2010
Volume: 6
Page(s): 2,705 - 2,708
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647472
Regular:

For large or complex objects, they have to be scanned many times to recover its entire 3D shape in reverse engineering applications. The object surface can be sampled point by point using a... View More

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