IEEE - Institute of Electrical and Electronics Engineers, Inc. - Non-rigid image registration based on Overlapped Block Check and Free-Form Deformation

3rd International Congress on Image and Signal Processing (CISP 2010)

Author(s): Mingyan Li ; Mingyan Jiang ; Mingqiang Yang ; Dengwang Li
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Yantai, China
Conference Date: 16 October 2010
Volume: 6
Page(s): 2,810 - 2,814
ISBN (CD): 978-1-4244-6515-6
ISBN (Electronic): 978-1-4244-6516-3
ISBN (Paper): 978-1-4244-6513-2
DOI: 10.1109/CISP.2010.5647413
Regular:

A new non-rigid registration approach is presented for the images which contain highly local deformation, using Free-Form Deformation (FFD) and Overlapped Block Check method. First of all, the... View More

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