IEEE - Institute of Electrical and Electronics Engineers, Inc. - High spectral quality defect-coupled 1550nm micro-disc lasers

2010 IEEE 22nd International Semiconductor Laser Conference (ISLC)

Author(s): Xinlun Cai ; Mezosi, G. ; Wang, Z. ; Yi Shu ; Sorel, M. ; Jiangbo Zhu ; Nan Chi ; Siyuan Yu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Kyoto, Japan, Japan
Conference Date: 26 September 2010
Page(s): 117 - 118
ISBN (CD): 978-1-4244-5682-6
ISBN (Electronic): 978-1-4244-5684-0
ISBN (Paper): 978-1-4244-5683-3
ISSN (CD): 0899-9406
ISSN (Paper): 0899-9406
DOI: 10.1109/ISLC.2010.5642723
Regular:

We demonstrate electrically-pumped room-temperature continuous-wave lasing in InP-based microdisks lasers with threshold current of 5mA. A defect on the disc circumference is used to extract the... View More

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