IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single facet teardrop laser with matched bends design

2010 IEEE 22nd International Semiconductor Laser Conference (ISLC)

Author(s): Wangqing Yuan ; Seibert, C.S. ; Hall, D.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Kyoto, Japan, Japan
Conference Date: 26 September 2010
Page(s): 207 - 208
ISBN (CD): 978-1-4244-5682-6
ISBN (Electronic): 978-1-4244-5684-0
ISBN (Paper): 978-1-4244-5683-3
ISSN (CD): 0899-9406
ISSN (Paper): 0899-9406
DOI: 10.1109/ISLC.2010.5642637
Regular:

A reflectance of 97% is simulated for a teardrop-shaped reflector of optimized matched bends design. A fabricated 808 nm single facet laser exhibits a threshold of 43 mA and slope efficiency of... View More

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