IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computerized adaptive testing: A new trend in language testing

2010 International Conference on Artificial Intelligence and Education (ICAIE)

Author(s): Jun Chen ; Lei Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Hangzhou, China, China
Conference Date: 29 October 2010
Page(s): 725 - 728
ISBN (CD): 978-1-4244-6934-5
ISBN (Electronic): 978-1-4244-6936-9
ISBN (Paper): 978-1-4244-6935-2
DOI: 10.1109/ICAIE.2010.5641509
Regular:

Computerized adaptive language testing (CALT), supported by item response theory (IRT) and Internet technologies, has become an important aspect in modern testing. This paper first reviews the... View More

Advertisement