IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new method for risk evaluation of technology innovation of SMEs

2010 International Conference on Artificial Intelligence and Education (ICAIE)

Author(s): Qu TianYi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Hangzhou, China, China
Conference Date: 29 October 2010
Page(s): 114 - 117
ISBN (CD): 978-1-4244-6934-5
ISBN (Electronic): 978-1-4244-6936-9
ISBN (Paper): 978-1-4244-6935-2
DOI: 10.1109/ICAIE.2010.5641135
Regular:

Risk evaluation of technology innovation is a complex issue, involving many factors. It is affected directly by the evaluators' knowledge, cognitive abilities and personal preferences, and hardly... View More

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