IEEE - Institute of Electrical and Electronics Engineers, Inc. - Emission-wavelength control using a mechanically stressed micro-beam structure: GaAs on Si-on-insulator beam

2010 7th IEEE International Conference on Group IV Photonics (GFP)

Author(s): Decosterd, L. ; Horie, Y. ; Yoshimoto, K. ; Suzuki, R. ; Jingnan Cai ; Osaka, J. ; Ishikawa, Y. ; Wada, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Beijing, China, China
Conference Date: 1 September 2010
Page(s): 72 - 74
ISBN (CD): 978-1-4244-6345-9
ISBN (Electronic): 978-1-4244-6346-6
ISBN (Paper): 978-1-4244-6344-2
DOI: 10.1109/GROUP4.2010.5643422
Regular:

Mechanically stressed micro-beam structures are proposed to control the emission wavelength for III-V compounds on Si-on-insulator wafers. Based on the calculations for GaAs, the tuning of... View More

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