IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabrication variations in SOI microrings for DWDM networks

2010 7th IEEE International Conference on Group IV Photonics (GFP)

Author(s): Peng, Z. ; Fattal, D. ; Fiorentino, M. ; Beausoleil, R.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Beijing, China, China
Conference Date: 1 September 2010
Page(s): 120 - 122
ISBN (CD): 978-1-4244-6345-9
ISBN (Electronic): 978-1-4244-6346-6
ISBN (Paper): 978-1-4244-6344-2
DOI: 10.1109/GROUP4.2010.5643406
Regular:

We present a statistical analysis of fabrications defects in microring resonators fabricated using 248 nm lithography. We measure the scatter of the resonators' quality factor, extinction ratio,... View More

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