IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical properties of Er x Yb 2−x Si 2 O 7 thin film grown by RF magnetron sputtering method

2010 7th IEEE International Conference on Group IV Photonics (GFP)

Author(s): Jun Zheng ; Yeliao Tao ; Wei Wang ; Yu Chen ; Zhihua Ma ; Chunlai Xue ; Yuhua Zuo ; Buwen Cheng ; Qiming Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Beijing, China, China
Conference Date: 1 September 2010
Page(s): 156 - 158
ISBN (CD): 978-1-4244-6345-9
ISBN (Electronic): 978-1-4244-6346-6
ISBN (Paper): 978-1-4244-6344-2
DOI: 10.1109/GROUP4.2010.5643394
Regular:

ErxYb2−xSi2O7 thin films are synthesized on thermally oxidized n-Si substrates by RF-magnetron co-sputtering and subsequent annealing process. The photoluminescence properties of... View More

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