IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hardware-based Reliability Tree (HRT) for fault tree analysis

2010 15th CSI International Symposium on Computer Architecture and Digital Systems (CADS)

Author(s): Rajabzadeh, A. ; Jahangiry, M.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Tehran, Iran, Iran
Conference Date: 23 September 2010
Page(s): 171 - 172
ISBN (CD): 978-1-4244-6268-1
ISBN (Electronic): 978-1-4244-6269-8
ISBN (Paper): 978-1-4244-6267-4
DOI: 10.1109/CADS.2010.5623587
Regular:

Reliability analysis of critical systems is performed using fault trees. Fault trees are then converted to their equivalent Binary Decision Diagram, Cut Set, Markov Chain or Bayesian Network.... View More

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