IEEE - Institute of Electrical and Electronics Engineers, Inc. - Consideration of physical constraints for regression line fitting in the task of blind mixed noise variance evaluation on images

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): S K Abramov ; V V Zabrodina ; V V Lukin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 1,229 - 1,230
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5633006
Regular:

The modification of blind method for mixed noise variance evaluation is proposed. The modification concerns adding constraints for location of a regression line fitted in the scatter-plot of local... View More

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