IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of scanning microwave tomography of subsurface targets

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): K P Gaikovich ; P K Gaikovich ; Ye S Maksimovitch ; V A Badeev
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 1,239 - 1,240
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632995
Regular:

Results of numerical simulation of the scanning microwave tomography of dielectric objects based on the inverse scattering problem solution by 2D data of multi-frequency near-surface microwave... View More

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