IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electron drift velocity in PHEMT

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): G I Ayzenshtat ; V G Bozhkov ; A Y Yushchenko
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 125 - 126
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632957
Regular:

The temperature dependence of drift velocity-field characteristics of two-dimensional electron gas in AlGaAs/InGaAs Pseudomorphic High Electron Mobility Transistor is determined. The saturation... View More

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