IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determination of law of fluctuations of back scattering diagram of underlying surfaces on basis of results of radiophysical investigations

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): A A Khrustalev ; S N Egorov
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 1,205 - 1,206
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632862
Regular:

The method of determination of law of fluctuations of BSD of various US, which were obtained as a result of remote probing and are required for development of catalogues of scattering signatures,... View More

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