IEEE - Institute of Electrical and Electronics Engineers, Inc. - The basic aspects of the general theory of scanning microwave microscopy

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): Yu Ye Gordienko ; S Yu Larkin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 1,029 - 1,030
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632786
Regular:

The numerical modeling of electrodynamics of interaction of the coaxial resonator microprobe with dielectric and semiconductor objects allowed ascertaining some dependence of signal parameters of... View More

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