IEEE - Institute of Electrical and Electronics Engineers, Inc. - Distribution of currents in film metalloidelectric structures at influence of powerful electromagnetic fields

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): V V Starostenko ; Ye P Taran ; M V Glumova ; D A Poletaev
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 938 - 939
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632773
Regular:

On the basis of numerically-analytical model of influence of powerful electromagnetic fields on film metal-dielectric structures are obtained distributions of currents of displacement and... View More

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