IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of the broad-side coupled lines on the vertical substrate using the numerical conformal transformations

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): A N Sychev ; M E Dolgushin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 636 - 638
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632696
Regular:

A new model of the broad-side coupled lines on vertical substrate (BCL VS) is developed. It is characterized by high computationally efficiency and sufficient accuracy in practice. This model is... View More

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