IEEE - Institute of Electrical and Electronics Engineers, Inc. - Express analysis of MMIC limiters reliability based on numerical modeling of thermal processes

2010 20th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo 2010)

Author(s): A A Vorobiyov ; A V Krutov ; A S Rebrov
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Sevastopol, Ukraine
Conference Date: 13 September 2010
Page(s): 216 - 217
ISBN (CD): 978-966-335-334-0
ISBN (Paper): 978-1-4244-7184-3
DOI: 10.1109/CRMICO.2010.5632524
Regular:

In the present article an express analysis of mmic limiters reliability based on numerical modeling of thermal processes are presented. The simulated results of diode maximum junction temperature... View More

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