IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting external measurement disturbances based on statistical analysis for smart sensors

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Dietrich, A. ; Zug, S. ; Kaiser, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 2,067 - 2,072
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5637754
Regular:

The transducer process of a sensor is interference-prone to environmental conditions or external disturbances depending on sensor type, measurement procedure etc. Dependable sensors are... View More

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