IEEE - Institute of Electrical and Electronics Engineers, Inc. - Distributed Bayesian network structure learning

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Yongchan Na ; Jihoon Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 1,607 - 1,611
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5637593
Regular:

We propose a new method for learning the structure of a Bayesian network from distributed data sources. Traditional Bayesian network learning takes place at the central site with all data. In many... View More

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