IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application-driven co-design of fault-tolerant industrial systems

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Restrepo-Calle, F. ; Martínez-Álvarez, A. ; Guzmán-Miranday, H. ; Palomoy, F.R. ; Cuenca-Asensi, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 2,005 - 2,010
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5637483
Regular:

This paper presents a novel methodology for the HW/SW co-design of fault tolerant embedded systems that pursues the mitigation of radiation-induced upset events (which are a class of Single Event... View More

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