IEEE - Institute of Electrical and Electronics Engineers, Inc. - Neural network visual inspection with boundary learning based on the distance index in input space

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Matsushima, M. ; Soeda, A. ; Fujie, H. ; Fukumoto, S. ; Fujimoto, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 1,742 - 1,747
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5637457
Regular:

In the field of electronics device assembly, miniaturization of components, denser packing of boards, surface mounting technology, and highly automated assembly equipment make the task of... View More

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