IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of selected diagnostic variables for the purpose of assessing the ageing effects in high-power IGBTs

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Sleszynski, W. ; Nieznanski, J. ; Cichowski, A. ; Luszcz, J. ; Wojewodka, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 821 - 825
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5637327
Regular:

A method is presented and discussed whereby to evaluate two basic diagnostic variables that can be used in the assessment of the health of high-power IGBT packs. The proposed approach attempts to... View More

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