IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability assessment of low-voltage MOSFETs driving inductive loads

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Testa, A. ; De Caro, S. ; Panarello, S. ; Patanè, S. ; Letor, R. ; Russo, S. ; Poma, S. ; Patti, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 1,016 - 1,021
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5636946
Regular:

Reliability and compactness are two aspects often fighting among themselves when speaking about power electronics, but, indeed, they are the keys for the success of any new circuit or device.... View More

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