IEEE - Institute of Electrical and Electronics Engineers, Inc. - Typical defects of PV-cells

2010 IEEE International Symposium on Industrial Electronics (ISIE 2010)

Author(s): Acciani, G. ; Falcone, O. ; Vergura, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Bari, Italy, Italy
Conference Date: 4 July 2010
Page(s): 2,745 - 2,749
ISBN (CD): 978-1-4244-6391-6
ISBN (Electronic): 978-1-4244-6392-3
ISBN (Paper): 978-1-4244-6390-9
DOI: 10.1109/ISIE.2010.5636901
Regular:

The paper introduces the issue of the typical defects in PhotoVoltaic (PV) cells and focuses the attention on two specific defects: linear edge shunt and hole. These defects are modeled by means... View More

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