IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sub-ppm linearity testing of a DMM using a Josephson Junction array

Author(s): J.I. Giem
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1991
Volume: 40
Page Count: 4
Page(s): 329 - 332
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/TIM.1990.1032951
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