IEEE - Institute of Electrical and Electronics Engineers, Inc. - An 8-bit 1.5GS/s flash ADC using post-manufacturing statistical selection

2010 IEEE Custom Integrated Circuits Conference -CICC 2010

Author(s): Proesel, J. ; Keskin, G. ; Plouchart, J.-O. ; Pileggi, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: San Jose, CA, USA, USA
Conference Date: 19 September 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-5759-5
ISBN (Electronic): 978-1-4244-5760-1
ISBN (Paper): 978-1-4244-5758-8
ISSN (CD): 0886-5930
ISSN (Electronic): 2152-3630
ISSN (Paper): 0886-5930
DOI: 10.1109/CICC.2010.5617410
Regular:

An 8-bit, 1.5GS/s flash ADC is presented. Comparators are digitally calibrated using statistical selection. INL of 1.32 LSB and DNL of 1.23 LSB are achieved. Average comparator noise of 5mVrms... View More

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