IEEE - Institute of Electrical and Electronics Engineers, Inc. - Algorithms for extracting invariant features of profile face image

2010 4th International Conference on Application of Information and Communication Technologies (AICT)

Author(s): Tuhktasinov, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2010
Conference Location: Tashkent, Uzbekistan, Uzbekistan
Conference Date: 12 October 2010
Page(s): 1 - 3
ISBN (CD): 978-1-4244-6904-8
ISBN (Paper): 978-1-4244-6903-1
DOI: 10.1109/ICAICT.2010.5612030
Regular:

In this work algorithm for extracting invariant features of profile face image are proposed. In order to determine identified invariant features of profile face image, new approaches, with the... View More

Advertisement