IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bidimensional Empirical Mode Decomposition for multiresolution image coding

2010 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA)

Author(s): Guaragnella, C. ; Manni, A. ; Palumbo, F. ; Politi, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Taranto, Italy, Italy
Conference Date: 6 September 2010
Page(s): 34 - 37
ISBN (CD): 978-1-4244-7229-1
ISBN (Electronic): 978-1-4244-7230-7
ISBN (Paper): 978-1-4244-7228-4
DOI: 10.1109/CIMSA.2010.5611762
Regular:

Bidimensional Empirical Mode Decomposition (BEMD) provides a tool for image processing for its special ability to locally separate spatial frequencies. The Intrinsic Mode Functions (IMFs) other... View More

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