IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and comparison of resonance grounding with low resistance grounding

2010 5th International Conference on Critical Infrastructure (CRIS)

Author(s): Lei Li ; Lixiao Duan ; Jingshu Zhou ; Jian Zhang ; Wenzhong Zhou ; Bo Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Beijing, China, China
Conference Date: 20 September 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-8079-1
ISBN (Electronic): 978-1-4244-8081-4
ISBN (Paper): 978-1-4244-8080-7
DOI: 10.1109/CRIS.2010.5617517
Regular:

The scale of medium voltage networks have been expanding and cables are increasingly used so that nowadays capacitance currents are much greater than before when single line-to-ground faults... View More

Advertisement