IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on the distribution of trap levels in PI by OPO laser

2010 10th Russian-Chinese Symposium on Laser Physics and Laser Technologies (RCSLPLT) & 2010 Academic Symposium on Optoelectronics Technology (ASOT)

Author(s): Lijuan He ; Dongni Wang ; Jinglei Cao ; Lei Zhao ; Xuan Wang ; Qingquan Lei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Harbin, China, China
Conference Date: 28 July 2010
Page(s): 167 - 169
ISBN (CD): 978-1-4244-5512-6
ISBN (Electronic): 978-1-4244-5513-3
ISBN (Paper): 978-1-4244-5511-9
DOI: 10.1109/RCSLPLT.2010.5615368
Regular:

In this paper, the photo-stimulated discharge (PSD) current spectra of polyimide (PI) are obtained by the optical parametric oscillator (OPO) laser to characterize the deep space charge traps in... View More

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