IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical filter of the window on 0∼25 degree incidence angle 980nm semiconductor detector

2010 10th Russian-Chinese Symposium on Laser Physics and Laser Technologies (RCSLPLT) & 2010 Academic Symposium on Optoelectronics Technology (ASOT)

Author(s): Lu Peng ; Liu Guojun ; Qu Yi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Harbin, China, China
Conference Date: 28 July 2010
Page(s): 109 - 111
ISBN (CD): 978-1-4244-5512-6
ISBN (Electronic): 978-1-4244-5513-3
ISBN (Paper): 978-1-4244-5511-9
DOI: 10.1109/RCSLPLT.2010.5615342
Regular:

In this paper a window with band-pass filter is used on 980nm semiconductor detector. The window is designed with substrate HW800, materials whose index are Nh=2.4, Nl=1.7, and center wavelength... View More

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