IEEE - Institute of Electrical and Electronics Engineers, Inc. - Seeds optimization algorithm of SIC test sequences in low power BIST

2010 10th Russian-Chinese Symposium on Laser Physics and Laser Technologies (RCSLPLT) & 2010 Academic Symposium on Optoelectronics Technology (ASOT)

Author(s): Xiao Liyi ; Cao Bei ; Wang Yongsheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2010
Conference Location: Harbin, China, China
Conference Date: 28 July 2010
Page(s): 352 - 355
ISBN (CD): 978-1-4244-5512-6
ISBN (Electronic): 978-1-4244-5513-3
ISBN (Paper): 978-1-4244-5511-9
DOI: 10.1109/RCSLPLT.2010.5615313
Regular:

Single input change (SIC) test sequence has been investigated in recent years because it is effective to reduce the test power consumption. Deterministic built-in self-test (BIST) can achieve the... View More

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