IEEE - Institute of Electrical and Electronics Engineers, Inc. - HLA-based parallel test grid simulation

2010 IEEE AUTOTESTCON

Author(s): Wang Lei ; Fang Yang-wang ; Xu Xin ; Hu Lei-Gang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 5
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613631
Regular:

Reconfigured Parallel Test Grid (RPTG) technology advanced a novel theory to improve test and ATE using efficiency. In order to analyze the function and efficiency of RPTG, it is important to... View More

Advertisement