IEEE - Institute of Electrical and Electronics Engineers, Inc. - Increasing yields with entropy-based analysis of test data

2010 IEEE AUTOTESTCON

Author(s): Engler, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613624
Regular:

Manufacturing test data is often analyzed with the direct goal of increasing production yields and reduction of variance within the product. Six Sigma and statistical process control methodologies... View More

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