IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using modern ANSI C development tools to increase productivity and ensure test and measurement application reliability

2010 IEEE AUTOTESTCON

Author(s): Kruger, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 3
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613623
Regular:

Over the past few decades, the ANSI C language has become one of the most popular test and measurement programming languages due to its power and flexibility. ANSI C applications can be optimized... View More

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