IEEE - Institute of Electrical and Electronics Engineers, Inc. - The case for embedded diagnostics used in conjunction with field test equipment

2010 IEEE AUTOTESTCON

Author(s): Westphalen, Jim ; Barton, Paul ; Tatem, Joe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613597
Regular:

Paper not available at time of production

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