IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhancing legacy General Purpose Interfaces

2010 IEEE AUTOTESTCON

Author(s): Headrick, W.J. ; Craig, D.J. ; Rousseau, R.P. ; Sarfi, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 4
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613594
Regular:

Modern Automatic Test Equipment (ATE) systems are expected to provide a platform for existing Test Program Sets (TPS), as well as enable testing of new much more advanced Units Under Test (UUT).... View More

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