IEEE - Institute of Electrical and Electronics Engineers, Inc. - State configuration controller for network centric organizational at-system level testing

2010 IEEE AUTOTESTCON

Author(s): Lospinuso, M. ; Marston, D. ; Gearhart, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 5
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613589
Regular:

Advanced diagnostic reasoners are being developed to make use of Bayesian fault probability distributions, experiential learning algorithms and actual net centric historical failure data to change... View More

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