IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave data link system testing

2010 IEEE AUTOTESTCON

Author(s): Spiegel, J.N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 5
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613586
Regular:

System integration testing (SIT) is still relied upon for final confirmation of data link products. SIT, a costly process, is still required for most circuit card sub-assemblies because of the... View More

Advertisement