IEEE - Institute of Electrical and Electronics Engineers, Inc. - The use of ATML in managing TPS developments and life cycle maintenance

2010 IEEE AUTOTESTCON

Author(s): Gorringe, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 2 - 6
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613577
Regular:

The paper considers the benefits and practicalities of using the Automatic Test Markup Language (ATML) family of Standards in Test Program Set (TPS) development and life cycle maintenance. As part... View More

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