IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accelerated aging system for prognostics of power semiconductor devices

2010 IEEE AUTOTESTCON

Author(s): Celaya, J.R. ; Wysocki, P. ; Vashchenko, V. ; Saha, S. ; Goebel, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Orlando, FL, USA, USA
Conference Date: 13 September 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-7959-7
ISBN (Electronic): 978-1-4244-7961-0
ISBN (Paper): 978-1-4244-7960-3
ISSN (CD): 1088-7725
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.2010.5613564
Regular:

Prognostics is an engineering discipline that focuses on estimation of the health state of a component and the prediction of its remaining useful life (RUL) before failure. Health state estimation... View More

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