IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deriving metric thresholds from benchmark data

2010 IEEE 26th International Conference on Software Maintenance (ICSM)

Author(s): Alves, T.L. ; Ypma, C. ; Visser, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Timi oara, Romania, Romania
Conference Date: 12 September 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-8629-8
ISBN (Paper): 978-1-4244-8630-4
ISBN (Online): 978-1-4244-8628-1
ISSN (Paper): 1063-6773
ISSN (Online): 1063-6773
DOI: 10.1109/ICSM.2010.5609747
Regular:

A wide variety of software metrics have been proposed and a broad range of tools is available to measure them. However, the effective use of software metrics is hindered by the lack of meaningful... View More

Advertisement