IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Eclipse plug-in for the detection of design pattern instances through static and dynamic analysis

2010 IEEE 26th International Conference on Software Maintenance (ICSM)

Author(s): De Lucia, A. ; Deufemia, V. ; Gravino, C. ; Risi, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Timi oara, Romania, Romania
Conference Date: 12 September 2010
Page(s): 1 - 6
ISBN (Electronic): 978-1-4244-8629-8
ISBN (Paper): 978-1-4244-8630-4
ISBN (Online): 978-1-4244-8628-1
ISSN (Paper): 1063-6773
ISSN (Online): 1063-6773
DOI: 10.1109/ICSM.2010.5609707
Regular:

The extraction of design pattern information from software systems can provide conspicuous insight to software engineers on the software structure and its internal characteristics. In this... View More

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