IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of test completeness and redundancy measurement on post release failures — An industrial experience report

2010 IEEE 26th International Conference on Software Maintenance (ICSM)

Author(s): Gergely, T. ; Beszedes, A. ; Gyimothy, T. ; Gyalai, M.I.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Timi oara, Romania, Romania
Conference Date: 12 September 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-8629-8
ISBN (Paper): 978-1-4244-8630-4
ISBN (Online): 978-1-4244-8628-1
ISSN (Paper): 1063-6773
ISSN (Online): 1063-6773
DOI: 10.1109/ICSM.2010.5609692
Regular:

In risk-based testing, compromises are often made to release a system in spite of knowing that it has outstanding defects. In an industrial setting, time and cost are often the "exit criteria" and... View More

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