IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test generation via Dynamic Symbolic Execution for mutation testing

2010 IEEE 26th International Conference on Software Maintenance (ICSM)

Author(s): Lingming Zhang ; Tao Xie ; Lu Zhang ; Tillmann, N. ; de Halleux, J. ; Hong Mei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Timi oara, Romania, Romania
Conference Date: 12 September 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-8629-8
ISBN (Paper): 978-1-4244-8630-4
ISBN (Online): 978-1-4244-8628-1
ISSN (Paper): 1063-6773
ISSN (Online): 1063-6773
DOI: 10.1109/ICSM.2010.5609672
Regular:

Mutation testing has been used to assess and improve the quality of test inputs. Generating test inputs to achieve high mutant-killing ratios is important in mutation testing. However, existing... View More

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