IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pairwise test set calculation using k-partite graphs

2010 IEEE 26th International Conference on Software Maintenance (ICSM)

Author(s): Salecker, E. ; Glesner, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Timi oara, Romania, Romania
Conference Date: 12 September 2010
Page(s): 1 - 5
ISBN (Electronic): 978-1-4244-8629-8
ISBN (Paper): 978-1-4244-8630-4
ISBN (Online): 978-1-4244-8628-1
ISSN (Paper): 1063-6773
ISSN (Online): 1063-6773
DOI: 10.1109/ICSM.2010.5609653
Regular:

Many software faults are triggered by unusual combinations of input values and can be detected using pairwise test sets that cover each pair of input values. The generation of pairwise test sets... View More

Advertisement