IEEE - Institute of Electrical and Electronics Engineers, Inc. - Guided test generation for coverage criteria

2010 IEEE 26th International Conference on Software Maintenance (ICSM)

Author(s): Pandita, R. ; Tao Xie ; Tillmann, N. ; de Halleux, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2010
Conference Location: Timi oara, Romania, Romania
Conference Date: 12 September 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-8629-8
ISBN (Paper): 978-1-4244-8630-4
ISBN (Online): 978-1-4244-8628-1
ISSN (Paper): 1063-6773
ISSN (Online): 1063-6773
DOI: 10.1109/ICSM.2010.5609565
Regular:

Test coverage criteria including boundary-value and logical coverage such as Modified Condition/Decision Coverage (MC/DC) have been increasingly used in safety-critical or mission-critical... View More

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